Created by sebastien.popoff on 03/08/2020


Parallelized STED microscopy using tailored speckles

[N. Bender et al., arxiv, 2007.15491 (2020)]

Super-resolution fluorescence microscopy techniques, such as stimulated emission depletion (STED), rely on depleting fluorescence around a region smaller than the limit of diffraction. This can be achieved with a doughnut-shaped beam that is then scanned to produce an image. Such a process is time-consuming. Structured illumination techniques were proposed to parallelize the process by having multiple zeros of the field in the same image, for example with an array of doughnut beams. However, it typically limits optical sectioning as the field conserves its shape for quite large distances along the axial direction. One way to overcome this limitation is to use speckle patterns. Speckle exhibits numerous singularities, allowing parallelization of the technique, and they rapidly and non-repeatably change along the axial direction, guarantying the optical sectioning while being robust to aberrations. The issue is that speckle singularities (optical vortices) are not isotropic, leading to distortions of the image. In the present paper, N. Bender and co-authors use wavefront shaping to design ideal speckle patterns for non-linear microscopy to achieve isotropic and uniform super-resolution.

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